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Actualités

Meet Taylor Hobson at AMTEX 2012 in India

29/06/12
Visit Taylor Hobson at EMSI 
 
The XXXIII Annual Meeting of the Electron Microscopy Society of India will be jointly organized by the Indian Institute of Science and the South Zone Chapter of EMSI during July 2-4, 2012. A large number of eminent researchers and microscopists from around the world are expected to attend this conference. The event offers an opportunity for networking with experts in the field, gain exposure to a variety of characterization techniques, and keep abreast of the latest advancements in micro- and nanoscale characterization. The conference will include plenary talks by leading experts in the field in addition to invited talks, poster sessions, metallography contest and tutorial sessions on latest developments in electron microscopy.
 
Date: 2 - 4  July  2012 
Venue: Indian Institute of Science, Bangalore 
 
Visit the show and see the:
FTS Intra
Surtronic 25
Surtronic Duo 
 
FTS Talysurf Intra 
A Precision Solution for surface finish and contour measurement 
 
  • 1 mm Vertical range / 16nm resolution 
  • 50mm horizontal traverse 
  • 0.5um horizontal data spacing 
  • Capability to measure large or tall components 
 
Surtronic 25
This new edition of the long - standing surtronic range brings a large display with the simplest of menu structures and the most up-to-date parameters.
  • Parameter Option to suit your option 
  • Fast Measurement Cycle 
  • Unique Stylus lift Mechanism for Total Flexibility
  • Storage of upto 100 readings .
  • Powerful Software Option 
 
 
Meet us at AMTEX 2012 
 
Date: 27th to 30th, July, 2012
Venue:Pragathi Maidan New delhi 
 
Visit the show and see the:
Form Talysurf Intra
Surtronic 25, Surtronic Duo
Surtronic R-series R125.
 
Surtronic R-series
A range of roundness products robust enough for the shop floor but accurate enough for any inspection room.
 
Working closely with manufacturers across a wide range of industries including precision bearings, automotive and aerospace engineering Taylor Hobson has focussed on the key attributes that are most important for quality control in today’s precision industries.
 
The new Surtronic R-series instruments offer a flexible solution for all your roundness and form requirements with a variety of systems and application specific accessories along with fixtures that can be tailored to your specific need.
 
  • Speed (3 parts/minute including set-up)
  • Precision (±25 nm spindle accuracy)
  • Robustness (suitable for 24/7 operation)
  • Ease of use (touchscreen software)
 
 
For more information please contact our local office in India: 
taylor-hobson.india@ametek.com
Toll Free No. 1860 266 2468